Skip to main content

Scanning electron microscope

Scanning electron microscope

JSM-7000F field-emission scanning electron microscope

The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source and state-of-the-art computer technology for the image-display system. The instrument is equipped for EDS and EBSD analysis.

  • Schottky Field Emission Cathode
  • High Resolution (1.2nm @30kV)
  • Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) Imaging
  • EDAX “Octane Pro” SDD Energy Dispersive Spectroscopy of X-rays (EDS)
  • EDAX “Hikari Pro” 600pps Electron Backscatter Diffraction (EBSD) detector
  • Electron Lithography

Laboratory for Molecular Physics and Synthesis of New Materials

This site uses cookies.

Some of these cookies are essential, while others help us improve your experience by providing insights into how the site is being used.

For more detailed information on the cookies we use, please check our Privacy Policy.

  • Necessary cookies enable core functionality. The website cannot function properly without these cookies, and can only be disabled by changing your browser preferences.