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Scanning electron microscope

Dec 12th 2017
Scanning electron microscope

JSM-7000F field-emission scanning electron microscope

The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source and state-of-the-art computer technology for the image-display system. The instrument is equipped for EDS and EBSD analysis.

  • Schottky Field Emission Cathode
  • High Resolution (1.2nm @30kV)
  • Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) Imaging
  • EDAX “Octane Pro” SDD Energy Dispersive Spectroscopy of X-rays (EDS)
  • EDAX “Hikari Pro” 600pps Electron Backscatter Diffraction (EBSD) detector
  • Electron Lithography

Laboratory for Molecular Physics and Synthesis of New Materials