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Marković, Lovro ; Knežević, Tihomir ; Nanver, Lis. K. ; Suligoj, Tomislav | Modeling and Simulation Study of Electrical Properties of Ge-on-Si Diodes with Nanometer-thin PureGaB Layer // 2021 44th International Convention on Information, Communication and Electronic Technology (MIPRO). | 2021. str. 64-69. doi: 10.23919/MIPRO52101.2021.9597002
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Nanver, L. K. ; Liu, X. ; Knezevic, Tihomir | Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon. | Institute of Electrical and Electronics Engineers (IEEE), 2018. str. 69-74. doi: 10.1109/icmts.2018.8383767
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Lovro Marković ; Tihomir Knežević ; Tomislav Suligoj | Modeling of Electrical Properties of Al-on-Ge-on-Si Schottky Barrier Diode // 2020 43rd International Convention on Information, Communication and Electronic Technology (MIPRO). | 2020. str. 28-33. doi: 10.23919/MIPRO48935.2020.9245134
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Krakers, M. ; Knežević, T. ; Batenburg, K.M. ; Liu, X. ; Nanver, L.K. | Diode design for studying material defect distributions with avalanche–mode light emission // 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). | Institute of Electrical and Electronics Engineers (IEEE), 2020, 9.2, 6. doi: 10.1109/icmts48187.2020.9107933
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Knežević, Tihomir ; Krakers, Max ; Nanver, Lis K. | Broadband PureGaB Ge-on-Si photodiodes responsive in the ultraviolet to near-infrared range // Proceedings SPIE 11276, Optical Components and Materials XVII, 112760I. | SPIE, 2020, 112760I, 13. doi: 10.1117/12.2546734
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Knežević, Tihomir ; Elsayed, Ahmed ; Dick, Jan F. ; Liu, Xingyu ; Schulze, Joerg ; Suligoj, Tomislav ; Nanver, Lis K. | Back-end-of-Line CMOS-Compatible Diode Fabrication with Pure Boron Deposition Down to 50°C // Proceedings of the ESSDERC 49th European Solid- State Device Research Conference. | Institute of Electrical and Electronics Engineers (IEEE), 2019. str. 242-245
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Krakers, Max ; Knezevic, T. ; Nanver, L. K. | Reverse breakdown and light-emission patterns studied in Si PureB SPADs // 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. | Opatija: Institute of Electrical and Electronics Engineers (IEEE), 2019. str. 30-35. doi: 10.23919/mipro.2019.8757007
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Knezevic, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav | Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment // Proceedings of SPIE - The International Society for Optical Engineering. | San Francisco (CA): SPIE, 2019, 109120Y, 8. doi: 10.1117/12.2508829
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Knezevic, Tihomir ; Suligoj, Tomislav ; Nanver, Lis K. | Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers // International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO). | Opatija: Institute of Electrical and Electronics Engineers (IEEE), 2019. str. 24-29. doi: 10.23919/mipro.2019.8757156
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Knezevic, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav | 2D dark-count-rate modeling of PureB single-photon avalanche diodes in a TCAD environment // Proceedings of SPIE Vol. 10526. | San Francisco (CA): SPIE, 2018, 105261K, 10. doi: 10.1117/12.2290757
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Knežević, Tihomir ; Nanver, Lis K. ; Capan, Ivana ; Suligoj, Tomislav | Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures // Proceedings of the 41st International Convention MIPRO 2018. | Rijeka: Institute of Electrical and Electronics Engineers (IEEE), 2018. str. 12-17. doi: 10.23919/mipro.2018.8399822
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Osrečki, Željko ; Knežević, Tihomir ; Nanver, Lis K. ; Suligoj, Tomislav ; | Indirect optical crosstalk reduction by highly- doped backside layer in PureB single-photon avalanche diode arrays // Proceedings of the 17th International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD 2017). | Institute of Electrical and Electronics Engineers (IEEE), 2017. str. 69-70
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Knežević, Tihomir ; Lis K. Nanver ; Suligoj, Tomislav | Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions // Proceedings of the 40th International Convention MIPRO 2017. | Rijeka: Hrvatska udruga za informacijsku i komunikacijsku tehnologiju, elektroniku i mikroelektroniku - MIPRO, 2017. str. 80-84
Knežević, Tihomir ; Suligoj, Tomislav | Examination of the InP/InGaAs single-photon avalanche diodes by establishing a new TCAD-based simulation environment // 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). | Nürnberg, 2016. str. 57-60
Knežević, Tihomir ; Suligoj, Tomislav | Analysis of Electrical and Optical Characteristics of InP/InGaAs Avalanche Photodiodes in Linear Regime by a New Simulation Environment // Proceedings of the 39th International Convention MIPRO 2016. | Rijeka: Hrvatska udruga za informacijsku i komunikacijsku tehnologiju, elektroniku i mikroelektroniku - MIPRO, 2016. str. 34-39
Berdalović, Ivan ; Osrečki, Željko ; Šegmanović, Filip ; Grubišić, Dragan ; Knežević, Tihomir ; Suligoj, Tomislav | Design of Passive-Quenching Active-Reset Circuit with Adjustable Hold-Off Time for Single-Photon Avalanche Diodes // Proceedings of the 39th International Convention MIPRO 2016. | Rijeka: Hrvatska udruga za informacijsku i komunikacijsku tehnologiju, elektroniku i mikroelektroniku - MIPRO, 2016. str. 40-45
Janeković, Ivan ; Knežević, Tihomir ; Suligoj, Tomislav ; Grubišić, Dragan | Optimization of floating guard ring parameters in separate-absorption-and-multiplication silicon avalanche photodiode structure // Proceedings of the 38th International Convention MIPRO 2015. | Rijeka, 2015. str. 37-41
Knežević, Tihomir ; Suligoj, Tomislav ; Šakić, Agata ; Nanver, Lis K. | Modelling of Electrical Characteristics of Ultrashallow Pure Amorphous Boron p<sup>+</sup>n Junctions // MIPRO 2012 - 35th International Convention on Information and Communication Technology, Electronics and Microelectronics - Proceedings. | Rijeka: Hrvatska udruga za informacijsku i komunikacijsku tehnologiju, elektroniku i mikroelektroniku - MIPRO, 2012. str. 42-47
Knežević, Tihomir ; Suligoj, Tomislav ; Šakić, Agata ; Nanver, Lis K. | Optimization of the perimeter doping of ultrashallow p<sup>+</sup>-n<sup>-</sup>-n<sup>-</sup> photodiodes // MIPRO 2011 - 34th International Convention on Information and Communication Technology, Electronics and Microelectronics - Proceedings. | Zagreb: Hrvatska udruga za informacijsku i komunikacijsku tehnologiju, elektroniku i mikroelektroniku - MIPRO, 2011. str. 44-48
Shi, L. ; Nanver, Lis K. ; Šakić, Agata ; Nihtianov, Stoyan N. ; Knežević, Tihomir ; Gottwald, Alexander ; Kroth, Udo | Series Resistance Optimization of High-Sensitivity Si-based VUV Photodiodes // IEEE Instrumentation and Measurement Technology Conference. | Binjiang: Institute of Electrical and Electronics Engineers (IEEE), 2011. str. 1-4
Šakić, Agata ; Nanver, Lis K. ; Van Veen, Gerard ; Kooijman, Kees ; Vogelsang, Patrick ; Scholtes, T. L. M. ; De Boer, W. B. ; Wien, W. ; Milosavljević, Silvana ; Heerkens, C. T. H. et al. | Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection // Technical Digest - International Electron Devices Meeting. | San Francisco (CA): Institute of Electrical and Electronics Engineers (IEEE), 2010. str. 31.4.1-31.4.4
Žilak, Josip ; Knežević, Tihomir ; Suligoj, Tomislav | Optimization of Stress Distribution in Sub-45 nm CMOS Structures // Proceedings of 45th International Conference on Microelectronics, Devices and Materials MIDEM 2009. | Ljubljana: Society for Microelectronics, Electronic Components and Materials (MIDEM), 2009. str. 85-90
Knežević, Tihomir ; Žilak, Josip ; Suligoj, Tomislav | Stress Effect in Ultra-Narrow FinFET Structures // Proceedings of 32nd International Convention MIPRO 2009. | Zagreb: Hrvatska udruga za informacijsku i komunikacijsku tehnologiju, elektroniku i mikroelektroniku - MIPRO, 2009. str. 89-94
