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Basic principle The atomic force microscope (AFM) scans the surface of a sample by measuring the interaction between the sharp tip attached to the flexible cantilever and the sample. AFM device consists of three main parts: piezoelectric scanner, scanning probe and system for detecting movement of the cantilever. The probe consists of a cantilever with a tip (SiN3, SiO2, carbon nanotube). Characteristics: -surface imaging in 3D at the subnanometre resolution (0.1 nm vertical, >1 nm lateral) -non-destructive method -the sample is in the native form in air or in liquid -measurement of intra- and inter-molecular forces, viscoelastic and other mechanical properties -suitable for macromolecules, polymers, vesicles, liquid crystals, colloids, cells and cell organelles, abiotic particles in natural conditions, different solid samples

General instrument information

Short name
AFM
Inventory number
0032683
Category
kapitalna (>1.000.000 kn)
Instrument type
mikroskop
Analysis type
strukturna analiza
Applications
vizualizacija
Standalone or bound
samostalan
Equipment condition
funkcionalan, ali zastario
Disciplines
Biologija , Fizika , Geofizika , Kemija
Year of manufacture
2004
Financing body
Ministarstvo znanosti i obrazovanja Republike Hrvatske
External link

Characteristics

Manufacturer
Bruker
Portability
No
Remote work
No

Location

Address
Bijenicka 54
Room
III. krilo/prvi kat/221

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