High resolution deep level transient spectroscopy (Laplace DLTS)
Electrical characterization of deep level defects in semiconductors.
General instrument information
Short name
Laplace DLTS
Inventory number
TBC
Category
srednja (200.000 – 1.000.000 kn)
Instrument type
spektrometar
Analysis type
spektroskopska analiza
Standalone or bound
samostalan
Disciplines
Fizika
, Elektrotehnika
Year of manufacture
2017
External link
Location
Room
I krilo/102